Cohesion and device reliability in organic bulk heterojunction photovoltaic cells

Publication year: 2011 Source: Solar Energy Materials and Solar Cells, Available online 23 December 2011 Vitali Brand, Christopher Bruner, Reinhold H. Dauskardt The fracture resistance of P3HT:PC60BM-based photovoltaic devices are characterized using quantitative adhesion and cohesion metrologies that allow identification of the weakest layer or interface in the device structure. We demonstrate that the phase separated bulk heterojunction layer is the weakest layer and report quantitative cohesion values which ranged from ∼1 to 20 J m

Publication year: 2011 Source: Solar Energy Materials and Solar Cells, Available online 23 December 2011 Vitali Brand, Christopher Bruner, Reinhold H. Dauskardt The fracture resistance of P3HT:PC60BM-based photovoltaic devices are characterized using quantitative adhesion and cohesion metrologies that allow identification of the weakest layer or interface in the device structure. We demonstrate that the phase separated bulk heterojunction layer is the weakest layer and report quantitative cohesion values which ranged from ∼1 to 20 J m

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Cohesion and device reliability in organic bulk heterojunction photovoltaic cells